Functional Materials Characterization by Electron Microscopy and Electron Energy Loss Spectroscopy

نویسندگان

  • Bo Yang
  • Terry L. Alford
چکیده

Spectroscopy to characterize several functional materials. Along with the fast development of science and technology, the studied materials is becoming more complicated and smaller. All these achievements has advanced with the fast development of powerful tools currently, such as Scanning electron microscopy(SEM), Focused Ion Beam(FIB), Transmission electron microscopy(TEM), Electron energy loss spectroscopy(EELS) and so on.

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تاریخ انتشار 2013